Original Paper(Vol.57 No.3 pp.304-309)

Evaluation of Microstructure for High-Strength Reaction-Sintered Silicon Carbide

Yoshiyasu ITOH and Shoko SUYAMA

Abstract:A newly developed high-strength reaction-sintered silicon carbide (SiC), which has two or three times higher strength than the normal sintered SiC, is one of the most promising candidates such as the lightweight substrate of optical mirror, because of fully dense, small sintering shrinkage (1%), good shape capability and low sintering temperature. In this paper, in order to improve the performance of newly developed reaction-sintered SiC, the microstructure was investigated by paying attention to the crystal structures and the interface of each crystals using the observation of transmission electron microscope and X-ray diffraction analysis. As a result, it made clear that the finer-scale microstructure could be observed as consisting of large particles (~1m in diameter) of starting powder -SiC and small particles (1m in diameter) of -SiC formed during the reaction (Si+CSiC) with the residual silicon filling the remaining porosity. Also, it was identified that the -SiC formed during the reaction referred to the cubic (3C) polytype and the -SiC of starting powder referred to the hexagonal (6H) polytype.

Key Words:High-strength, Reaction-sintering, Silicon carbide, Residual silicon, Microstructure, Transmission electron microscope, Electron diffraction, Mercury intrusion method, X-ray diffraction