Study of fracture mechanism and effect of particle volume fraction on fracture properties of silica particulate filled epoxy resins
Yaguchi Akihiro; Nishimura Asao
Abstract:Epoxy resins for encapsulating integrated circuit (IC) devices are filled with silica particles to reduce the thermal expansion coefficient and to improve thermal conductivity. Recently, the size of chips mounted in a package has increased rapidly with advances in large scale integration technology. This trend creates a problem: increased mechanical stress in the package, which sometimes causes cracking in the encapsulation resin under temperature cycling. Hence, evaluation of the fracture properties of these materials has become an important issue in package design. This study reports the effects of the filler particle volume fraction on the static strength of smooth specimens and fracture toughness of silica particulate filled epoxy resins for IC encapsulation. The smooth specimen strength and fracture toughness were measured, respectively, by the three point bending test and the double torsion test.