Original paper(Vol.48 No.7 pp.678)

Abstract:The X-ray diffraction method was applied to measure the change of the lattice strain and domain switching in tetragonal lead zirconate titanate (PZT) due to poling and applied strains. The lattice strain was determined from the linear relation between the diffraction angle and sin²ƒÕ. The lattice strain measured by X-rays in less than 50% of the macrostrain determined from the dimensional change due to poling. The applied strain induced the increase of the lattice strain, and the amount of increase was about 50% of the applied strain. The amount of domain switching was evaluated by the change of the intensity ratio of 002 diffraction to 200 diffraction. The intensity ratio was decreased with the applied strain. The broadening of X-ray diffraction profiles obtained from the diffraction plane perpendicular to the polinf direction was the maximum, indicating the largest microstrain in the polinf direction.

Key Words:X-ray strain measurement, Piezoelectric ceramics, Lead zirconate titanate, Polarization, Domain switching, Lattice strain