Stress Evaluation by Diffraction Using Neutron and Synchrotron Radiation ‡U: Residual Stress Measurements on Thin Films and Microscopic Area
Takao HANABUSA and Koichi AKITA
Key Words:X-ray stress measurement, Synchrotron, X-ray diffraction, Residual stress, Thin film, Fiber texture, Microscopic area, Crack tip, Single crystal