Evaluation of Ductile Damage in Aluminum Single Crystal with Prior Activity of Single Slip System under Tensile Loading
Jun-ichi SHIBANO, Kentaro KAJIWARA, Takuya TSUKAMOTO, Hirokazu KAWAI, Setsuo MIURA, Zhang SHUOYUAN and Takahisa SHOBU
Abstract:A ductile damage progress of an aluminum single crystal with the prior activity of the single slip system under tensile loading was verified by a profile analysis using white X-ray obtained in BL28B2 beam line of SPring-8. In this study, the aluminum single crystal of the purity 6N was used as a specimen prepared in I-type geometry for tensile test. A notch was introduced into one side of the center of a parallel part of the specimen by the wire electric discharge machining. White X-ray beam, which has 50m in both height and width, was incident into the specimen on the Bragg angle of 3 degrees using energy dispersive X-ray diffraction technique. The specimen was deformed by elongation in the direction of 45to [111] and [110] crystal orientations, respectively, and a diffraction profile of the white X-rays from Al220 plane was analyzed. In profile analysis, an instrumental function was defined in consideration both of a divergence by slits and a response function peculiar to the energy dispersive method. The Gauss component of integral breadth related to non-uniform strain and the Cauchy component of integral breadth related to crystallite size were determined by eliminating the broadening by the instrumental function from the diffraction profile of white X-rays. As a result, dislocation density increased as ductile damage progressed, but it was relatively low near the notch. The influence of a release of the strain energy by a ductile damage progress was expected. The characteristics of ductile damage progress near the notch of the aluminum single crystal with a prior activity of a single slip system under the tensile loading were clarified from the distribution of dislocation density. Key Words: Aluminum single crystal, Ductile damage, Crystal orientation, Profile analysis, Dislocation density, White X-ray